Title:
METHOD AND PROGRAM FOR SETTING PROCESSING OF STRUCTURE ANALYSIS CONDITION AND ITS PROGRAM RECORDING MEDIUM
Document Type and Number:
Japanese Patent JP2003006240
Kind Code:
A
Abstract:
To easily achieve setting of load and constraint conditions in a structure analysis condition setting and processing method for structure analysis by using a computer.
A model of a structure to be analyzed is read into a structure analysis processing device by imaging technique using a CT scan. Then, the preset positions of the load and constraint conditions are inputted to the place to apply a load or constraint by marking with substances of different transmission factors of X ray so as to be automatically recognized. At each preset position, a menu of analysis conditions inputted in advance is exhibited to make an analyzer select it.
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Inventors:
TANAKA YUJI
Application Number:
JP2001192479A
Publication Date:
January 10, 2003
Filing Date:
June 26, 2001
Export Citation:
Assignee:
FUJITSU NAGANO SYSTEMS ENGINEE
International Classes:
G06F17/50; G06T15/08; G06T19/00; (IPC1-7): G06F17/50; G06T15/00; G06T17/40
Domestic Patent References:
| JPH05266150A | 1993-10-15 | |||
| JPH08339456A | 1996-12-24 | |||
| JPH1196398A | 1999-04-09 | |||
| JPH05266150A | 1993-10-15 | |||
| JPH08339456A | 1996-12-24 | |||
| JPH1196398A | 1999-04-09 |
Attorney, Agent or Firm:
Yoshiyoshi Ogasawara (2 outside)