METHOD AND SYSTEM OF EVALUATING SURFACE ROUGHNESS OF IMAGE FORMING APPARATUS COMPONENT, AND METHOD AND SYSTEM FOR CUTTING

Title:

METHOD AND SYSTEM OF EVALUATING SURFACE ROUGHNESS OF IMAGE FORMING APPARATUS COMPONENT, AND METHOD AND SYSTEM FOR CUTTING

Document Type and Number:

Japanese Patent JP2007292772

Kind Code:

A

Abstract:

To highly sensitively and correctly know a local change or modification of a surface to be measured in measuring surface roughness of an image forming apparatus component such as a substratum for use of an electrophotographic photoreceptor.

A profile curve defined in JIS B0601 is calculated on a surface condition of the image forming apparatus component such as the electrophotographic photoreceptor substratum. Multiple resolution analysis such as wavelet transformation of a positional data row in the surface roughness direction at equal intervals on the profile curve is performed, and the surface roughness condition is evaluated based on the results.

Inventors:

YAMAZAKI JUNICHI

Application Number:

JP2007119975A

Publication Date:

November 08, 2007

Filing Date:

April 27, 2007

Export Citation:

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Assignee:

RICOH KK

International Classes:

G01B21/30; G03G5/00; G03G5/10; G03G21/00

Domestic Patent References:

JPH10160453A	1998-06-19
JPH0979997A	1997-03-28
JP2004020429A	2004-01-22

Attorney, Agent or Firm:

Koichi Hirota

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