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Title:
METHOD AND SYSTEM FOR INSPECTING OBJECT
Document Type and Number:
Japanese Patent JP2007121295
Kind Code:
A
Abstract:

To provide a method and a system for inspecting an object.

This method for inspecting the object 12 includes the emission of light 40 from a light source 22, the projection of the light emitted from the light source onto a surface of the object, the division of light reflected from the object surface to the first image and the second image, the reception of the first image and the second image using an imaging sensor, and the analysis of the first and second images received by the imaging sensor 24 to facilitate the inspection at least one part of the object.


Inventors:
HARDING KEVIN GEORGE
Application Number:
JP2006287382A
Publication Date:
May 17, 2007
Filing Date:
October 23, 2006
Export Citation:
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Assignee:
GEN ELECTRIC
International Classes:
G01B11/02; G01B11/24; G01B11/26; G01B11/30; G01N21/88
Domestic Patent References:
JPH0755432A1995-03-03
JPH11183124A1999-07-09
JPS5724810A1982-02-09
JP2002134391A2002-05-10
Foreign References:
US6084712A2000-07-04
Attorney, Agent or Firm:
Kenichi Matsumoto
Hirokazu Ogura
Toshihisa Kurokawa
Arakawa Satoshi