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Patent Searching and Data


Title:
METHOD FOR TESTING DEVICE TO BE TESTED AND ITS DEVICE
Document Type and Number:
Japanese Patent JP2001028199
Kind Code:
A
Abstract:

To obtain a method and a device for testing a device to be tested by which a device to be tested in which hazard is caused can be detected as a defective product.

This method is for testing a device to be tested by which the test of a device 1 is performed by comparing output data from the device 1 with an expected value of the output data on the basis of the timing of a strobe signal. When rise/fall edges are detected twice or more between the strobes of different expected values (from the previous comparison time to the present comparison time) or a rise/fall edge is detected even only once between the strobes of the same expected values, it is discriminated that hazard is caused in the device 1 to be tested.


Inventors:
KASAME TOMOHIDE
Application Number:
JP20023899A
Publication Date:
January 30, 2001
Filing Date:
July 14, 1999
Export Citation:
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Assignee:
FUJITSU TEN LTD
International Classes:
G11C29/00; G11C29/56; G01R31/28; (IPC1-7): G11C29/00; G01R31/28
Attorney, Agent or Firm:
Ryuji Inouchi