Title:
完全なミュラー行列測定から液晶セルパラメータを決定するための方法および装置
Document Type and Number:
Japanese Patent JP4425979
Kind Code:
B2
Abstract:
Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test (14, 30) may be mounted to translatable table (40) between polarization state generator (10) and polarization state analyzer (16). For each location on cell (14, 30) to be tested, a variety of known polarization states (22) are launched through LCD cell (14, 30) and detected by polarization state analyzer (16). Electrical signals representative of polarization states are acquired by computer (18). Within computer (18), a model (58, 60) of polarization properties of LCD cell (14, 30) is developed based on estimations of what physical parameters of LCD cell (14, 30) are believed to be. RMS differences between simulated polarization properties and measured polarization properties are minimized by iteratively refining (60) modeled physical cell properties, at which point cell thickness and other physical parameters of the LCD cell may be deduced.
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Inventors:
Smith, Matthew H.
Application Number:
JP2008515919A
Publication Date:
March 03, 2010
Filing Date:
June 09, 2006
Export Citation:
Assignee:
Axometrics Inc.
International Classes:
G02F1/13; G01J4/04; G01M11/00; G01N21/21
Domestic Patent References:
| JP4080641A | ||||
| JP2001165809A | ||||
| JP2001159751A | ||||
| JP2002350119A | ||||
| JP2000241292A |
Attorney, Agent or Firm:
Hidekazu Miyoshi
Masakazu Ito
Yuko Hara
Masakazu Ito
Yuko Hara