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Title:
測定対象のオブジェクト厚さ及び電気伝導度を測定するための方法及びデバイス
Document Type and Number:
Japanese Patent JP4559435
Kind Code:
B2
Abstract:
A method for non-contact measurement of a dimension and/or an electrical property in an electrically conducting object to be measured by using electromagnetic induction. An electromagnetic field is brought to penetrate through the object to be measured. A transmitter coil is place on one side of the object to be measured. A receiver coil is placed on the other side of the object to be measured. A magnetic field is generated in the transmitter coil. A sudden change is generated in the magnetic field generated in the transmitter coil from one level to another. The voltage induced in the receiver coil is detected. The period of time that elapses from the time of the change of the magnetic field in the transmitter coil up to the time when a voltage starts to be induced in the receiver coil is determined. The magnitude of the induced voltage is determined. The thickness and/or electrical conductivity of the object to be measured is calculated.

Inventors:
Linder, Sten
Application Number:
JP2006546919A
Publication Date:
October 06, 2010
Filing Date:
December 22, 2004
Export Citation:
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Assignee:
Arbor Arbor
International Classes:
G01B7/06; G01B7/02; G01N27/72; G01R27/00; G01R27/02; B60K
Domestic Patent References:
JP59231447A
JP2500215A
JP2003503683A
JP59231446A
JP4334115A
JP5231810A
JP11513496A
JP11326284A
JP2000009414A
JP2000502189A
JP2001041703A
Attorney, Agent or Firm:
Satoshi Kono
Makoto Nakamura
Kurata Masatoshi
Takashi Mine
Yoshihiro Fukuhara
Toshio Shirane
Sadao Muramatsu
Nobuhisa Nogawa
Katsu Sunagawa
Ryo Hashimoto
Tetsuya Kazama