METROLOGICAL SYSTEM, IRRADIATION DEVICE, COMPUTATION DEVICE AND METROLOGICAL METHOD

Japanese Patent JP2015219209

A

PROBLEM TO BE SOLVED: To provide a metrological system, irradiation device and metrological method that can easily meter a three-dimensional coordinate of a metrological object.SOLUTION: A metrological system 1 comprises: an irradiation device 10 that irradiates a first irradiation line L1 with laser light at a predetermined first irradiation angle, and irradiates a plurality of second irradiation lines L2 crossing the first irradiation line L1 with the laser light at a plurality of second irradiation angles, respectively; an imaging device 20 that acquires a two-dimensional image of an area R1 including the first irradiation line and the plurality of second irradiation lines L2; and a controller 100 that calculates the plurality of second irradiation angles on the basis of the first irradiation angle, and a position of a point on the first irradiation line L1 and a point on the plurality of second irradiation lines L2 in the two-dimensional image, and calculates a three-dimensional coordinate of the point on the plurality of irradiation lines L2 on the basis of the plurality of second irradiation angles, and the position of the point on the plurality of second irradiation lines L2 in the two-dimensional image.

WO/2021/113645	COMBINED PHASE DEPTH IMAGING
JP7276166	Three-dimensional measuring device
JP4986679	3D image measurement device for non-stationary objects, 3D image measurement method and 3D image measurement program

ICHIMARU YUJI

JP2014105045A

December 07, 2015

May 21, 2014

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YASKAWA ELECTRIC CORP

G01B11/25

Yoshiki Hasegawa
Yasunori Ishizaka
Shigeki Matsuo

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