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Patent Searching and Data


Title:
MICROSCOPE CALIBRATION DEVICE
Document Type and Number:
Japanese Patent JPH11151249
Kind Code:
A
Abstract:

To provide a device used for calibrating a microscope for a surgical operation.

A microscope calibration probe 50 is provided with a handle 55, a tool head 60 connected to the handle 55, an observable target 90 connected to the end of the tool head 60 opposite to the handle 55 and three or more position signal devices 75a-75c arranged at the handle 55 so as to track the probe 50 in an image guide type surgical operation system. The tool head 60 is provided with the bend part of about 90° so as to easily arrange the observable target 90 to an object observed under the microscope and the other angle of the bend part can be accepted as well. The accurate position of the observed object is decided by sensing the position of a part where the three or more position signal devices 75a-75c are arranged at the handle 55 to the reference frame of an operation room and then recognizing deviation between the position signal devices 75a-75c and the lower surface of the observable target 90 in contact with the object. Further, the observable target 90 is provided with an observation hole 95 for calibrating the line of sight of the microscope and a means for instructing the rotating direction of the observable target 90.


Inventors:
MESSNER DALE A
SCHELLENLBERG JOHN D
DAYTON PATRICK A
Application Number:
JP27127698A
Publication Date:
June 08, 1999
Filing Date:
September 25, 1998
Export Citation:
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Assignee:
PICKER INT INC
International Classes:
A61B19/00; G02B21/00; (IPC1-7): A61B19/00; G02B21/00
Attorney, Agent or Firm:
Minoru Nakamura (6 outside)