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Patent Searching and Data


Title:
MICROSCOPY IMAGING METHOD
Document Type and Number:
Japanese Patent JP2015215624
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a high-resolution microscope having spatial resolution that is not limited by a diffraction limit and requires no lenses or computational correction algorithms to produce high-resolution images.SOLUTION: An imaging device has a photosensitive pixel array 203, and a surface associated with the array 203 is configured to receive a specimen with at least a part of the specimen at a distance, from the surface, that satisfies a near-field criterion. Or, the surface associated with the array 203 may be configured to receive a specimen with at least a part of the specimen at a distance, from the surface, that is equivalent to less than about half of an average width of the pixels.

Inventors:
ALAN MARC FINE
PETER HODGES GREGSON
ROBERT BENDER
Application Number:
JP2015132271A
Publication Date:
December 03, 2015
Filing Date:
July 01, 2015
Export Citation:
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Assignee:
ALENTIC MICROSCIENCE INC
International Classes:
G02B21/36; G01N1/00; G01N1/28; G01N21/64; G02B21/06; G02B21/26; H04N5/225
Domestic Patent References:
JPH04316478A1992-11-06
JPS58182267A1983-10-25
JPS63229426A1988-09-26
JPH05219937A1993-08-31
JPH1164215A1999-03-05
JP2009065178A2009-03-26
JP2008192813A2008-08-21
JPS6471172A1989-03-16
JP2001078175A2001-03-23
JP2006003653A2006-01-05
JPS62262001A1987-11-14
Attorney, Agent or Firm:
Hatsushi Shimizu
Masao Haruna
Hirotaka Yamaguchi
Toshi Gobe
Ryuichi Inoue
Toshimitsu Sato
Koichi Niimi
Tomohiko Kobayashi
Masato Ozeki
Yoshihiro Igarashi
Kazuya Kawamoto