Title:
MICROWAVE FREQUENCY DETERMINATION METHOD, LEVEL MEASUREMENT DEVICE AND LEVEL MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2023000239
Kind Code:
A
Abstract:
To provide a method and the like that determine a proper frequency of a microwave in a level measurement device measuring the level of a bath face inside a furnace by using the microwave.SOLUTION: The present invention relates to a method that determines a proper frequency of a microwave in a level measurement device 100 comprising: an antenna 10; and a signal processing unit 20, and measuring a level of a bath face 3 by transmitting and receiving the microwave toward the bath face inside a furnace 1. The method is configured to calculate the reception signal intensity of the microwave represented by the amount of attenuation of the microwave by dust inside the furnace, and an antenna gain of the antenna as a function of the frequency of the microwave; calculate a noise level represented by thermal noise of the signal processing unit and radiation noise from the bath face as a function of the frequency of the microwave; and determine the frequency of the microwave so that a SN ratio to be determined by the reception signal intensity of the microwave and the noise level is equal to or more than a prescribed threshold.SELECTED DRAWING: Figure 1
More Like This:
Inventors:
KINOSHITA TAKAHIRO
SUGIBASHI ATSUSHI
SUGIBASHI ATSUSHI
Application Number:
JP2021100947A
Publication Date:
January 04, 2023
Filing Date:
June 17, 2021
Export Citation:
Assignee:
NIPPON STEEL CORP
International Classes:
G01F23/284; C21C5/46; F27D21/00; G01S13/08; G01S13/34
Attorney, Agent or Firm:
Patent Attorney Corporation Makoto International Patent Office
Previous Patent: LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD
Next Patent: Electronic device and its control method and program
Next Patent: Electronic device and its control method and program