To provide a moisture detection device capable of detecting moisture with high sensitivity by using an InP system photodiode wherein a dark current is reduced without a cooling mechanism and light-receiving sensitivity is enlarged to a wavelength of 1.8 μm or more.
This moisture detection device is described as follows: a light receiving layer 3 has a multiple quantum well structure of III-V group semiconductor; a pn junction 15 is formed by diffusing selectively an impurity element into the light receiving layer; band gap energy of a diffusion concentration distribution adjustment layer is smaller than band gap energy of III-V group semiconductor substrate; an impurity concentration in the light receiving layer is 5×10
COPYRIGHT: (C)2011,JPO&INPIT
Yoichi Nagai
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Seiichi Watanabe