Title:
MONITORING DEVICE, MONITORING SYSTEM, MONITORING METHOD AND PROGRAM
Document Type and Number:
Japanese Patent JP2023167542
Kind Code:
A
Abstract:
To provide a monitoring device which can monitor the state of a limited visibility spot.SOLUTION: A monitoring device comprises: an acquisition unit which acquires a measurement result obtained by measuring a plurality of spots of an object with a sensor; an analysis unit which analyzes the behavior of the plurality of spots on the basis of the measurement result; and a dynamic load estimation unit which estimates a dynamic load applied to an arbitrary spot of interest of the object on the basis of the analysis result of the behavior of the plurality of spots and an analysis model by means of a finite element method of the object.SELECTED DRAWING: Figure 1
Inventors:
GOTO NAOTAKA
IWASAKI AKIHISA
IWASAKI AKIHISA
Application Number:
JP2022078812A
Publication Date:
November 24, 2023
Filing Date:
May 12, 2022
Export Citation:
Assignee:
MITSUBISHI HEAVY IND LTD
International Classes:
G01M99/00
Attorney, Agent or Firm:
Yasushi Matsunuma
Eisuke Ito
Hiroyuki Hashimoto
Ancient city Satoshi
Koichiro Kamada
Eisuke Ito
Hiroyuki Hashimoto
Ancient city Satoshi
Koichiro Kamada
Previous Patent: Operating device and beverage supply device
Next Patent: Inspection method judgment tool and inspection method judgment method
Next Patent: Inspection method judgment tool and inspection method judgment method