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Title:
MONITORING SYSTEM AND MONITORING METHOD
Document Type and Number:
Japanese Patent JP2015168378
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a monitoring system capable of improving monitoring accuracy without increasing a camera installation cost, and a monitoring method.SOLUTION: A monitoring system 1 according to the present invention includes an imaging part 71, an abnormality detection part 72, and an imaging control part 73. The imaging part 71 takes an image of a monitoring target. The abnormality detection part 72 detects an abnormality in the monitoring target on the basis of information different from data on the image taken by the imaging part 71. The imaging control part 73 controls an imaging direction of the imaging part 71 on the basis of the result of detection performed by the abnormality detection part 72.

Inventors:
TSUJIMURA SEIJI
Application Number:
JP2014046319A
Publication Date:
September 28, 2015
Filing Date:
March 10, 2014
Export Citation:
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Assignee:
NEC PLATFORMS LTD
International Classes:
B60R25/10; B60R25/31; B60R25/32; B60R25/34; G08B13/00; G08B15/00; G08B21/00; G08B25/00; H04N7/18
Domestic Patent References:
JP2002373386A2002-12-26
JP2009143453A2009-07-02
JP2004155354A2004-06-03
JP2003182525A2003-07-03
JP2011139278A2011-07-14
JP2008242597A2008-10-09
JP2001014575A2001-01-19
JP2005210674A2005-08-04
JPH03130900A1991-06-04
JP2000125033A2000-04-28
Foreign References:
WO2004046985A12004-06-03
Attorney, Agent or Firm:
Ken Ieiri