Title:
積層セラミックコンデンサの検査方法及び積層セラミックコンデンサの製造方法
Document Type and Number:
Japanese Patent JP7110902
Kind Code:
B2
Abstract:
To provide a method for inspecting a laminated ceramic capacitor, which can detect a new crack generated during the inspection of structural defects with high reliability.SOLUTION: A method includes a measurement step of measuring a value of a current flowing through a laminated ceramic capacitor 1 while applying a voltage to the laminated ceramic capacitor 1. The measurement step includes a determination step of determining the laminated ceramic capacitor 1 in which an abnormal current has been detected as abnormal. In the measurement step, a voltage is applied to the laminated ceramic capacitor 1 such that a current flowing through the laminated ceramic capacitor 1 falls below a predetermined current value when there is no structural defect.SELECTED DRAWING: Figure 5
Inventors:
Tomoyuki Otani
Yoshioka Nishioka
Hiroo Fujii
Yoshioka Nishioka
Hiroo Fujii
Application Number:
JP2018195842A
Publication Date:
August 02, 2022
Filing Date:
October 17, 2018
Export Citation:
Assignee:
MURATA MANUFACTURING CO.,LTD.
International Classes:
H01G13/00; G01R31/00; H01G4/30
Domestic Patent References:
| JP9152455A | ||||
| JP2000228338A | ||||
| JP2005223253A | ||||
| JP2008180546A | ||||
| JP8227826A | ||||
| JP2003107118A | ||||
| JP2009295606A |
Attorney, Agent or Firm:
Patent Attorney Osaka Front Patent Office