Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
METHOD FOR APPARATUS FOR MEASURING ROTATIONAL DEFLECTION OR OUTLINE
Document Type and Number:
Japanese Patent JPH0642947
Kind Code:
A
Abstract:

PURPOSE: To obtain a method and an apparatus for measuring the rotational reflection or outline of an article to be inspected, without requiring any measuring unit or precise support for the article.

CONSTITUTION: Positional fluctuation of one or more than two reference surfaces 9, 11 on an article along first and second tracking axes 17, 19 is measured at a plurality of rotational positions of the article. Positional fluctuation of a target surface 13, for which the rotational deflection and outline are measured, is measured along a third tracking axis 21 included in a plane 23, substantially common with the first and second tracking axes. Positional fluctuation of the rotational axis of the article along the third tracking axis is measured from the positional fluctuation of one or more than two reference surfaces and the separation distance of the tracking axes. Subsequently, the measurement is subtracted from the positional fluctuation of the target surface along the third tracking axis, thus the rotational reflection and the outline are determined.


Inventors:
TOOMASU REI MIRAA
BURUTSUKU KENTO SAMONDO
HANSU AAMINIO RIYUUMAN
RARII JIYOSEFU APORONIA
Application Number:
JP20333191A
Publication Date:
February 18, 1994
Filing Date:
July 18, 1991
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
WESTINGHOUSE ELECTRIC CORP
International Classes:
G01B21/00; G01M1/16; (IPC1-7): G01B21/00
Attorney, Agent or Firm:
Koichiro Kato (2 outside)