Title:
X-RAY FLUORESCENCE ANALYTIC METHOD FOR SULFUR
Document Type and Number:
Japanese Patent JPH075127
Kind Code:
A
Abstract:
PURPOSE: To provide an X-ray fluorescence analytic method for sulfur in which the concentration of sulfur can be measured highly accurately by employing a standard sample exhibiting stabilized quality for a long term.
CONSTITUTION: In an X-ray fluorescence analytic method for determining the concentration of sulfur in a sample using a working curve obtained from a standard sample, and the ration between the fluorescent X-rays and the scattering X-rays emitted from a sample upon irradiation with primary X-rays 2, a simulation sample 10 comprising a simulation sample body 11 of molybdenum and an X-ray absorber 12 is substituted for the standard sample.
Inventors:
KIRA AKIMICHI
HOSOKAWA YOSHINORI
OKADA YOSHIAKI
MIZUTA MASAO
HOSOKAWA YOSHINORI
OKADA YOSHIAKI
MIZUTA MASAO
Application Number:
JP16754193A
Publication Date:
January 10, 1995
Filing Date:
June 14, 1993
Export Citation:
Assignee:
HORIBA LTD
International Classes:
G01N23/223; (IPC1-7): G01N23/223
Attorney, Agent or Firm:
Hideo Fujimoto
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