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Patent Searching and Data


Title:
PRODUCTION OF SEMICONDUCTOR ELEMENT
Document Type and Number:
Japanese Patent JPH0582617
Kind Code:
A
Abstract:

PURPOSE: To facilitate process control and prevent the lead deformation and the shape defects of a semiconductor element by performing resin part marking, lead cutting, formation and appearance inspection of the semiconductor element of a lead frame whose resin sealing process is completed by using one device.

CONSTITUTION: A lead frame whose major part is resin sealed, lead other than a hanging lead are cut and whose characteristic inspection of semiconductor elements are completed is supplied to a carrying means by a lead frame supplying part 100. Then, the lead frame resin part is marked by a marking part 200 according to the inspection results from the characteristic inspection. The hanging leads of the lead frame are cut to be in the prescribed shape as a semiconductor element. Appearance inspection is carried out by an appearance inspecting part 400 and semiconductor elements are stored on the tray 510 of a semiconductor storing part 500 by performance based on the characteristic inspection results and the appearance inspection results. Thus, the process control is facilitated and lead deformation is prevented.


Inventors:
IWASAKI NORIKI
Application Number:
JP26848391A
Publication Date:
April 02, 1993
Filing Date:
September 18, 1991
Export Citation:
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Assignee:
SHARP KK
International Classes:
H01L21/56; H01L21/62; H01L21/66; (IPC1-7): H01L21/56; H01L21/62; H01L21/66
Domestic Patent References:
JPS5563854A1980-05-14
JPH02134839A1990-05-23
JPH02105550A1990-04-18
JPS55135763A1980-10-22
Attorney, Agent or Firm:
Koji Onishi