NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-nDMA)

Title:

NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-nDMA)

Document Type and Number:

Japanese Patent JP2023162445

Kind Code:

A

Abstract:

To allow for determining mechanical properties of a surface of a viscoelastic sample.SOLUTION: Disclosed are atomic-force-microscope-based apparatus and method, including hardware and software, configured to dynamically collect and analyze data representing mechanical properties of soft materials on a nanoscale, and to map viscoelastic properties of a soft-material sample. A use of the apparatus as an addition to the existing atomic-force microscope device is also disclosed.SELECTED DRAWING: Figure 1

Inventors:

SERGEY OSECHINSKIY
ANTHONIUS RUITER
BEDE PITTENGER
SYED-ASIF SYED-AMANULLA

Application Number:

JP2023146623A

Publication Date:

November 08, 2023

Filing Date:

September 11, 2023

Export Citation:

Click for automatic bibliography generation Help

Assignee:

BRUKER NANO INC

International Classes:

G01Q60/24; G01N3/00; G01N19/00

Attorney, Agent or Firm:

Tatsuya Saitoh

Previous Patent: Solid fuel combustion equipment

Next Patent: Disaster prevention equipment