NEUROPATHOLOGICAL ABNORMALITY DIAGNOSIS SYSTEM AND INTRACEREBRAL DAMAGE DIAGNOSIS SYSTEM

Japanese Patent JP2023105973

A

To provide a neuropathological abnormality diagnosis system capable of finding out a degree of neuropathological abnormality using body temperatures measured on the right side and the left side with a temperature of a spinous process upper skin of the spinal column as a central part temperature.SOLUTION: A neuropathological abnormality diagnosis system includes a body temperature measuring device 2 for measuring a body temperature and a diagnostic processing device 33 for diagnosing the body temperature measured by the body temperature measuring device 2. The body temperature measuring device 2 includes first to third temperature sensors, the first temperature sensor 10 measuring a first body surface temperature on a spinous process surface side of the vertebra, the second temperature sensor 12 measuring a second body surface temperature on a left lateral protrusion surface side of the vertebra, and the third temperature sensor 14 measuring a third body surface temperature on a right lateral protrusion surface side of the vertebra, and finds out generation parts of a neuropathological abnormality in the vicinity of the spine using these body surface temperatures. First to third shallow part temperatures (deep part temperatures) of these parts are determined by the first to third body surface temperatures, and the neuropathological abnormality is found out accurately from these shallow part temperatures (deep part temperatures).SELECTED DRAWING: Figure 3

MIKATA SABURO
ABE TSUYOSHI

JP2022007042A

August 01, 2023

January 20, 2022

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RAY & COMPANY INC

A61B5/01; A61B10/00; G01K13/20

Tadaaki Kishimoto
Hiromi Matsushita

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