Title:
中性子検出組立体および中性子検出アレイ
Document Type and Number:
Japanese Patent JP5374030
Kind Code:
B2
Abstract:
An atomic particle detection assembly includes at least one atomic particle detector positioned within a first chamber having a first operating pressure. The assembly also includes at least one junction apparatus coupled to the at least one atomic particle detector. The at least one junction apparatus includes at least one wall that at least partially defines a second chamber having a second operating pressure. The second pressure is greater than the first pressure and the at least one junction apparatus facilitates maintaining a predetermined pressure difference between the first chamber and the second chamber.
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Inventors:
Curl atterback
Application Number:
JP2007163428A
Publication Date:
December 25, 2013
Filing Date:
June 21, 2007
Export Citation:
Assignee:
GENERAL ELECTRIC COMPANY
International Classes:
G01T7/00; G01T1/18; G01T1/205; G01T3/00; G01T3/06
Domestic Patent References:
JP2003207573A | ||||
JP63040244A | ||||
JP62197784A | ||||
JP57059185A |
Attorney, Agent or Firm:
Arakawa Satoshi
Hirokazu Ogura
Toshihisa Kurokawa
Takuto Tanaka
Hirokazu Ogura
Toshihisa Kurokawa
Takuto Tanaka