Title:
NON-LAMBERT SURFACE INSPECTION SYSTEM FOR LINE SCAN
Document Type and Number:
Japanese Patent JP2022055348
Kind Code:
A
Abstract:
To prevent a problem of conventional surface inspection systems, that is, the occurrence of a glare phenomenon when a surface of a curved model is inspected.SOLUTION: An inspection system of the present invention includes: a surface inspection unit 10 including a frame module provided with a curved stationary hole on at least one of one surface and the other surface and a shooting hole at a top, and a first lighting module and a second lighting module that are a plurality of modules installed in the stationary hole and output light diagonally toward an inspection body placed on a floor; a camera unit 20 that is located above the shooting hole, shoots the inspection body located on the floor through the shooting hole, and generates an overall composite image including a first lighting image and a second lighting image; and a controller unit 30 that controls operation of the camera unit, selectively operates the first lighting module and second lighting module, extracts the first lighting image and second lighting image from the received overall image taken by the camera unit, and generates the composite image by synthesizing after processing with a formula already set.SELECTED DRAWING: Figure 1
Inventors:
KWEON IN SOO
YOON YEO HAK
CHUN UNG JUN
PARK SU YEOL
YOON YEO HAK
CHUN UNG JUN
PARK SU YEOL
Application Number:
JP2021156561A
Publication Date:
April 07, 2022
Filing Date:
September 27, 2021
Export Citation:
Assignee:
HIVE VISION CO LTD
International Classes:
G01N21/88
Attorney, Agent or Firm:
Kichi Toshio Kawa
Hiroshi Ichikawa
Hiroshi Ichikawa