Title:
OBJECT INSPECTION SYSTEM AND DISPLAY CONTROL METHOD
Document Type and Number:
Japanese Patent JP2023118249
Kind Code:
A
Abstract:
To efficiently reduce the influence of ambient light when an object is inspected in a factory.SOLUTION: An object inspection device 10 comprises: measuring ambient light for a predetermined period with a spectroscopic part 13a; identifying a standard wavelength band whose light intensity is a threshold or less in all time zones; further measuring the ambient light at a predetermined time with the spectroscopic part 13a; identifying a wavelength band whose light intensity is a threshold or less at the predetermined time; then comparing the identified two wavelength bands to selectively process a wavelength band appropriate for imaging; irradiating an object 50 with light in the identified wavelength band through a filter 14b that transmits light of the selectively processed wavelength band and does not transmit light other than that of the wavelength band; and imaging light reflected from the object 50 with an imaging part 13b through a filter 13c that transmits light of the selectively processed wavelength band and does not transmit light other than that of the wavelength band.SELECTED DRAWING: Figure 1
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Inventors:
KABASHIMA HARUKI
Application Number:
JP2022021100A
Publication Date:
August 25, 2023
Filing Date:
February 15, 2022
Export Citation:
Assignee:
TOYOTA PROD ENG CORP
International Classes:
G01N21/84; G03B11/00; G03B15/00; G03B15/02; G03B15/03; G03B15/05; G03B17/18; H04N23/55; H04N23/56
Attorney, Agent or Firm:
Shiro Nakatsuji
Junichi Suwa
Junichi Suwa