Title:
OPERATING METHOD OF X-RAY DIAGNOSTIC APPARATUS FOR PREPARING INSTANT IMAGE
Document Type and Number:
Japanese Patent JP2002186606
Kind Code:
A
Abstract:
To provide a means that makes it possible to judge whether or not an exposure is properly made or an object is perfectly photographed immediately after image formation.
An X-ray image is pretreated with a parameter for perfect resolution before the X-ray image is transformed to an image for lower resolution. An image for lower resolution is treated with an image compatible with lower resolution and/ or a parameter before the image for lower resolution is instantly reproduced. Further, the X-ray image is treated with a parameter for perfect resolution before the X-ray image with perfect resolution is reproduced.
Inventors:
SPAHN MARTIN DR
Application Number:
JP2001278023A
Publication Date:
July 02, 2002
Filing Date:
September 13, 2001
Export Citation:
Assignee:
SIEMENS AG
International Classes:
G01T1/00; A61B6/00; G01N23/04; G01T1/17; G01T1/20; G03B42/02; G06T1/00; G06T3/40; H04N1/387; H04N5/232; H04N5/32; H04N5/321; H04N7/18; (IPC1-7): A61B6/00; G01T1/00; G01T1/17; G06T1/00; G06T3/40; H04N1/387; H04N5/321; H04N7/18
Domestic Patent References:
| JP2000163565A | 2000-06-16 |
Attorney, Agent or Firm:
Iwao Yamaguchi