Title:
ナノメートルのサンプルを観察するための光学部品、これを含むシステム、これを用いる解析方法、及びその使用方法
Document Type and Number:
Japanese Patent JP2008506098
Kind Code:
A
Abstract:
The invention concerns an optical component for observing a sample, which includes a substrate and at least one complex index layer of predetermined thickness, designed to show a high intensity or color contrast for optical path variations, reliefs, nanometric thicknesses and diameters when it is observed by incoherent light reflection convergent around the normal incidence under polarization extinction conditions. The upper index layer has specific surface properties providing it with selective affinity relative to at least one characteristic of the sample. An analysis system includes such a component, an analysis method using the component and uses of the method.
Inventors:
Aussere, Dominique
Application Number:
JP2007519841A
Publication Date:
February 28, 2008
Filing Date:
July 06, 2005
Export Citation:
Assignee:
SOCIETE ELECTRONIQUE DE COMBREE-SELCO
International Classes:
G01N21/21; G01N33/483; G01N33/543
Domestic Patent References:
| JP2004516469A | 2004-06-03 |
Attorney, Agent or Firm:
Hironobu Onda
Makoto Onda
Makoto Onda