Title:
OPTICAL FILM INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2016045194
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an optical film inspection device that can precisely detect various different types of defects.SOLUTION: The present invention relates to an optical film inspection device including a light source emitting light from one side of a film to be transferred and an imaging device imaging the film. The optical film inspection device can easily detect various types of defects only with one light source or imaging device since one light source or imaging device alone can easily observe the defects and obtain images taken under different imaging conditions because of overlap of a light irradiation region of the film and an imaged region of the film.SELECTED DRAWING: Figure 1
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Inventors:
LEE EUN GYU
EOM DONG-HWAN
PARK JAE-HYUN
EOM DONG-HWAN
PARK JAE-HYUN
Application Number:
JP2015159408A
Publication Date:
April 04, 2016
Filing Date:
August 12, 2015
Export Citation:
Assignee:
DONGWOO FINE CHEM CO LTD
International Classes:
G01N21/89
Attorney, Agent or Firm:
Takeshi Ebe
Inoue Akifumi
Kazuo Asahi
Inoue Akifumi
Kazuo Asahi