Title:
【発明の名称】半導体レーザの光周波数偏移量の測定,制御装置
Document Type and Number:
Japanese Patent JP3207211
Kind Code:
B2
Inventors:
Hideyuki Miyata
Hiroshi Onaka
Hiroshi Onaka
Application Number:
JP4971291A
Publication Date:
September 10, 2001
Filing Date:
March 14, 1991
Export Citation:
Assignee:
富士通株式会社
International Classes:
G01J9/02; G01J11/00; H01S5/00; H04B10/07; H04B10/2507; H04B10/516; H04B10/548; H04B10/564; H04B10/61; H04L27/18; (IPC1-7): G01J9/02; G01J11/00
Domestic Patent References:
| JP242329A | ||||
| JP2235016A | ||||
| JP2275303A | ||||
| JP2166425A |
Attorney, Agent or Firm:
Yoshiyuki Osuge (1 outside)