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Patent Searching and Data


Title:
PACKAGING QUALITY FACTOR ANALYSIS METHOD
Document Type and Number:
Japanese Patent JP2005286015
Kind Code:
A
Abstract:

To analyze various failure factors by performing comparative analysis for the result of a preceding process in a packaging process and to stabilize quality by restraining quality defect.

The method has a function 2 for narrowing down a process which is considered as a factor based on repair result which is quality final information in the packaging process, a function 3 for narrowing down a process and a failure factor by comparing to the inspection result of the preceding process based on a component name and a lead number and a function 4 for narrowing down the failure factor the process based on inspection measurement result. Since quality defect can be restrained by investigating the true factor of generated failures, quality is stabilized.


Inventors:
HISATAKE YOICHI
KANEMATSU KOICHI
SHIMODA RIICHI
YOKOMORI TADASHI
Application Number:
JP2004096295A
Publication Date:
October 13, 2005
Filing Date:
March 29, 2004
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
H05K3/34; H05K13/08; (IPC1-7): H05K3/34; H05K13/08
Attorney, Agent or Firm:
Kenhide Okazaki
Toshio Nishizawa