Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PARTICLE-OPTICAL ELECTROSTATIC LENS
Document Type and Number:
Japanese Patent JP2005108842
Kind Code:
A
Abstract:

To make magnetic shield of an electrostatic lens system easy by reducing a space especially occupied by a lens.

In a charged particle beam exposure device, an electrostatic lens (ML) has some (at least three) electrodes surrounding a particle beam optical path with rotational symmetry (EFR, EM, EFN), and the electrodes are coaxially arranged on a common optical axis indicating a center of the optical path and has different electrostatic potentials applied through a power supply system. At least one sub set (a partial aggregate) of the electrode (EM) forms an electrode array realized as a series of electrodes continuously arranged along the optical axis and in a substantially equivalent shape. An outside part of the electrode (EM) of the electrode array has outside parts (OR) of corresponding opposite faces (f1, f2) respectively facing toward the next and the preceding electrodes. A length of the electrode (EM) is preferably at least 4.1 times (3 times) of an inner radius (ril) of the faces (fi, f2).


Inventors:
STENGL GERHARD
BUSCHBECK HERBERT
LAMMER GERTRAUD
Application Number:
JP2004281985A
Publication Date:
April 21, 2005
Filing Date:
September 28, 2004
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
IMS NANOFABRICATION GMBH
International Classes:
H01J37/09; H01J37/12; H01J37/305; H01L21/027; (IPC1-7): H01J37/305; H01J37/09; H01J37/12; H01L21/027
Domestic Patent References:
JP2001283755A2001-10-12
JPH088097A1996-01-12
JPH0384839A1991-04-10
JP2001243908A2001-09-07
JPH05334979A1993-12-17
Attorney, Agent or Firm:
Nobuyuki Matsubara
Kiyoji Muraki
Kenichi Nakayama
Hashimoto Chikako
Sayaka Matsushima
High Iku child