PARTICLE SCREENING AND SAMPLING APPARATUS AND ITS ACQUIRING METHOD

Title:

PARTICLE SCREENING AND SAMPLING APPARATUS AND ITS ACQUIRING METHOD

Document Type and Number:

Japanese Patent JP2006043500

Kind Code:

A

Abstract:

To provide an inexpensive particle screening and sampling apparatus with simple constitution requiring no optical detection unit, no high voltage, and no complicated control, while quickly screening and sampling particles at a high concentration.

This particle screening and sampling apparatus comprises means of: forming liquid droplets from liquid containing magnetic particles having different magnetizing force; deflecting the proceeding direction of the magnetic particles in accordance with the magnitude of magnetizing force of the magnetic particles; and collecting liquid droplets corresponding to the amount of the deflection.

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Inventors:

NUMAJIRI YASUYUKI

Application Number:

JP2004224075A

Publication Date:

February 16, 2006

Filing Date:

July 30, 2004

Export Citation:

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