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Title:
PARTICULATE FOREIGN MATERIAL INSPECTING DEVICE USING PARTICULATE SIEVING DEVICE
Document Type and Number:
Japanese Patent JP2012007999
Kind Code:
A
Abstract:

To provide a particulate foreign material inspecting device using a particulate sieving device capable of sieving particulates with a simple structure.

A particulate foreign material inspecting device using a particulate sieving device comprises; a particulate supply mechanism 13 for supplying stored particulates; a sieving device body 15a for sieving with a sieving net 15h after the particulates supplied by the particulate supply mechanism 13 are charged; an elastic supporting member 15v for elastically supporting the sieving device body 15a on a fixed part; and a vibration generating source 15w for transmitting a vibration with being attached to the sieving device body. The particulates sieved by the sieving device are equalized while being conveyed by a powder conveying mechanism and foreign materials mixed in the powder supplied by the powder conveying mechanism are inspected by a foreign material inspecting mechanism.


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Inventors:
AKATSUKA MITSUO
INOUE AKINORI
HIKICHI HARUO
Application Number:
JP2010144086A
Publication Date:
January 12, 2012
Filing Date:
June 24, 2010
Export Citation:
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Assignee:
FUJI ELECTRIC CO LTD
International Classes:
G01N21/85; B65G69/12
Domestic Patent References:
JP2000146848A2000-05-26
JP2001129483A2001-05-15
JPH11190697A1999-07-13
Attorney, Agent or Firm:
Ichi Hirose
Hide Tanaka Tetsu