特許分析システム、装置、及び方法

Title:

特許分析システム、装置、及び方法

Document Type and Number:

Japanese Patent JP4273084

Kind Code:

B2

Abstract:

To improve precision as the data of a patent map.

This patent analyzing device is provided with an input device 41 for inputting technology data, a storage device 44 in which score data weighted for every patent information parameter are stored, a data processor 42 for ranking every patent information parameter for an applicant, and for applying scores corresponding to the rank to every patent according to the score data, and for preparing a patent list in the order of scores for every applicant, and for automatically extracting patents whose scores are high rank as patents included in a core technology and a display device 43 for displaying tabulation/analysis results prepared by the data processor 42.

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Inventors:

Shinichi Emoto
Masahiko Arai
Akiyuki Nakamura
Kimio Arai
Yasuhiro Ariga
Kikuhisa Taniguchi
Ryoji Ikeya

Application Number:

JP2005016344A

Publication Date:

June 03, 2009

Filing Date:

January 25, 2005

Export Citation:

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Assignee:

NEC
Impatec Co., Ltd.

International Classes:

G06F17/30

Domestic Patent References:

JP6231141A
JP2000137750A
JP2000181966A
JP2001092825A
JP2002279058A
JP2004005671A

Attorney, Agent or Firm:

Kenho Ikeda
Shuichi Fukuda
Takashi Sasaki

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