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Title:
PATTERN CLASSIFICATION LEARNING DEVICE
Document Type and Number:
Japanese Patent JP2012181579
Kind Code:
A
Abstract:

To provide a device capable of rasing generalization capability of a classifier in a learning device of pattern classifier by LGM-MCE learning.

An expression (1) is used to define an error classification scale value Dy(x;Λ) for measuring a degree of error classification of a sample x belonging to a class Cy. An expression, gy(x;Λ) based on ψ>0, shows a discrimination function for a belonging degree of x to Cy. A learning device executes: a step for obtaining the error classification scale values of the sample belonging to Cy; a step for, with setting a real probability distribution generating them as a Parzen distribution of a window width hy centering on each of the error classification scale values, evaluating likelihood of the distribution with a function of hy; a step for estimating the likelihood through cross-validation most likelihood estimation; a step for using an expression, αy=4/((2π)1/2*hy), to calculate an optimal value αy of lost smoothness, with respect to hy that provides a most likelihood distribution; and a step for adjusting a learning parameter Λ so as to minimize an empirical average loss that is a function of αy.


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Inventors:
WATANABE HIDEYUKI
Application Number:
JP2011042282A
Publication Date:
September 20, 2012
Filing Date:
February 28, 2011
Export Citation:
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Assignee:
NAT INST INF & COMM TECH
International Classes:
G06F17/30
Attorney, Agent or Firm:
清水 敏