Title:
視野計
Document Type and Number:
Japanese Patent JP6474740
Kind Code:
B2
Abstract:
In a perimetry to be conducted, designating an inspection region through a region designator, a perimeter is configured to set a required time of the perimetry (upper limit time) through an upper limit condition setter and to determine total number or positions of stimulus presentation spots based upon the upper limit time. In such a configuration, an examinee knows the time to finish the inspection, and is able to highly keep his (her) concentration in comparison with a case where the required time is not known, thereby improving precision of the inspection.
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| JP4205150 | Perimeter |
Inventors:
Ken Shimada
Takuya Hara
Takuya Hara
Application Number:
JP2015562807A
Publication Date:
February 27, 2019
Filing Date:
February 09, 2015
Export Citation:
Assignee:
Kowa Co., Ltd.
International Classes:
A61B3/024
Domestic Patent References:
| JP2013132502A | ||||
| JP2007195787A | ||||
| JP2011206105A |
Attorney, Agent or Firm:
Shinji Aida
Zheng Yuanji
Kyoko Aida
Zheng Yuanji
Kyoko Aida