Title:
PATTERN MATCHING DEVICE FOR GRADATION PICTURE
Document Type and Number:
Japanese Patent JP3223384
Kind Code:
B2
Abstract:
PURPOSE: To reduce correlation arithmetic quantity and to shorten processing time by setting a picture element to be a pattern matching object when the second-order differential absolute value of density data in the constitution picture element of a model pattern exceeds a threshold.
CONSTITUTION: A gradation picture obtained by image-picking up an objective model is inputted to a differential measurement part 14 through an A/D converter 13 and is stored in a picture memory 16 as the model pattern. The image- picked up picture being the object of measurement is stored in a picture memory 17. The differential measurement part 14 carrys out second-order differentiation on the density data on the respective picture elements and takes the absolute value. LUT 15 is for binarizing the absolute value by the prescribed threshold. When the absolute value of the second-order differential value is given as an address, binarized data is outputted from a corresponding address area and it is stored in a binary memory 18 in the unit of the picture element. Then, only the picture element where the absolute value of the second-order differential value of density data exceeds the prescribed threshold among the respective constitution picture elements of the model pattern is set to be that being the object of pattern matching.
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Inventors:
Masahiro Kawachi
Application Number:
JP18585992A
Publication Date:
October 29, 2001
Filing Date:
June 19, 1992
Export Citation:
Assignee:
Omron Corporation
International Classes:
G06K9/62; G06T7/00; G06T7/60; G06K9/36; (IPC1-7): G06T7/60; G06K9/36; G06K9/62
Domestic Patent References:
| JP3240176A | ||||
| JP63244182A | ||||
| JP418685A | ||||
| JP3127285A |
Attorney, Agent or Firm:
Yoshimitsu Suzuki