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Title:
PHOTOSENSITIVE RESIN COMPOSITION FOR INTERLAYER INSULATION FILM OF SEMICONDUCTOR DEVICE, INTERLAYER INSULATION FILM USING THE SAME AND METHOD FOR MANUFACTURING INTERLAYER INSULATION FILM
Document Type and Number:
Japanese Patent JP2008197160
Kind Code:
A
Abstract:

To provide a photosensitive resin composition for an interlayer insulation film of a semiconductor device capable of ensuring adequate developability and enabling image to be formed with good resolution in a thick film while using a polyimide resin precursor, and enabling an interlayer insulation film excellent in flexibility to be formed.

The photosensitive resin composition for an interlayer insulation film of a semiconductor device comprises (A) an alkali-soluble polyamic acid having a structure represented by a general formula (1), (B) a photopolymerizable compound having a urethane bond and an ethylenically unsaturated group in a molecule, and (C) a photopolymerization initiator.


Inventors:
KATO SADAAKI
MATSUZAKA OSAMU
TANIMOTO AKITOSHI
Application Number:
JP2007029450A
Publication Date:
August 28, 2008
Filing Date:
February 08, 2007
Export Citation:
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Assignee:
HITACHI CHEMICAL CO LTD
International Classes:
G03F7/037; C08F2/44; C08F299/06; C08G73/10; C08L79/08; G03F7/004; G03F7/027; H01L21/027
Attorney, Agent or Firm:
Yoshiki Hasegawa
Shiro Terasaki
Ryugo Akahori