Title:
物理量測定装置
Document Type and Number:
Japanese Patent JP7091476
Kind Code:
B2
Abstract:
Provided is a physical quantity measurement device capable of reducing a frequency analysis error of a gas flow rate as compared with the related art. A physical quantity measurement device 20 includes a flow rate sensor 205 and a signal processing unit 260. The signal processing unit 260 has a buffer 261, an offset adjustment unit 262, a gain calculation unit 263, a correction calculation unit 264, and a frequency analysis unit 265. The buffer 261 stores a flow rate data based on an output signal of the flow rate sensor 205 for a predetermined period. The offset adjustment unit 262 adjusts the zero point of the flow rate waveform. The gain calculation unit 263 calculates a correction gain of the flow rate waveform whose zero point has been adjusted. The correction calculation unit 264 performs the correction by multiplying the flow rate waveform whose zero point has been adjusted by the correction gain. The frequency analysis unit 265 performs a frequency analysis calculation of the corrected flow rate waveform and stores the data obtained by the calculation in the buffer 261. The gain calculation unit 263 calculates the correction gain at which the overflow does not occur in the frequency analysis unit 265.
Inventors:
Isoya Yuuki
Hiroaki Hoshika
Hiroaki Hoshika
Application Number:
JP2020558406A
Publication Date:
June 27, 2022
Filing Date:
November 19, 2019
Export Citation:
Assignee:
Hitachi Astemo, Ltd.
International Classes:
G01F1/68; G01F1/696; G01R23/16
Domestic Patent References:
| JP58132672A | ||||
| JP1197667A | ||||
| JP5026921A |
Attorney, Agent or Firm:
Hiraki International Patent Office
Previous Patent: Similarity determination device, method and program
Next Patent: Edaravone pharmaceutical composition
Next Patent: Edaravone pharmaceutical composition