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Patent Searching and Data


Title:
PLANT MEASUREMENT CONTROL SYSTEM
Document Type and Number:
Japanese Patent JP2000132218
Kind Code:
A
Abstract:

To execute excellent control even by using a measuring unit of a long measurement cycle by measuring a state of a plant in a shorter cycle than the measurement cycle of the measuring unit.

Plural measurement units 10, 11 and 12 measure a process state for one measurement point 9 and also a control part 17 for controlling a data collection cycle of the measurement units is constituted inside a control device 16. Then, the control part 17 measures a state of a plant in shorter cycle than the measurement cycle of the plural measurement units 10, 11 and 12. That is, when the measurement cycle of the measurement device is defined as (m) seconds and the number of the devices defined as (n), the control part 17 performs activation of measurement start from a device 1, a device 2 to a device (n) in this order in every m/n second. Thus, it is possible to execute excellent control even by using the measurement unit of a longer measurement cycle.


Inventors:
SHIMIZU YASUSHI
Application Number:
JP30667198A
Publication Date:
May 12, 2000
Filing Date:
October 28, 1998
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
G05B11/36; G05B21/02; (IPC1-7): G05B21/02; G05B11/36
Attorney, Agent or Firm:
Ogawa Katsuo