Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PLASMA ETCHING AND DEVICE THEREFOR
Document Type and Number:
Japanese Patent JPS6372122
Kind Code:
A
Abstract:

PURPOSE: To improve a throughput in the case of a gas chopping process by providing a moving means, through which a sample is alternately moved to and from between an etching gas plasma and a deposition gas in a treatment chamber.

CONSTITUTION: A gas introduction into a treatment chamber 1 is separately carried out through induction ports 30 and 31 and then upper and lower electrodes are periodically ascended or descended by a driving gear 4 that makes the upper electrode 2 go up and down as well as the driving gear 5 that makes the lower electrode 3 go up and down. A wafer 7 is periodically moved to and from between one region rich in the gas A and other region rich in the gas B. Since the above mechanical operation eliminates the need for changing over the gas inside of the treatment chamber and can perform continuously a gas chopping process, this approach helps improve a throughput in the case of the gas chopping process.


Inventors:
HAMAZAKI RYOJI
FUJII TAKASHI
Application Number:
JP21578586A
Publication Date:
April 01, 1988
Filing Date:
September 16, 1986
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI LTD
International Classes:
H01L21/302; H01L21/205; H01L21/3065; (IPC1-7): H01L21/205; H01L21/302
Domestic Patent References:
JPS6053013A1985-03-26
JPS61113778A1986-05-31
Attorney, Agent or Firm:
Katsuo Ogawa