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Patent Searching and Data


Title:
PLATE FOR EXAMINATION AND EXAMINATION METHOD USING THE SAME PLATE FOR EXAMINATION
Document Type and Number:
Japanese Patent JP2006038726
Kind Code:
A
Abstract:

To provide a plate for examination, in particular, to appropriately leave an up-stream side substance in an up-stream side storage chamber while guiding the substance to a down-stream side storage chamber automatically or at an arbitrary time point after a down-stream side substance is stored, and an examination method using the same plate for examination.

This plate for examination comprises a flow path 4, the up-stream side storage chamber 5 connected to the up-stream side of the flow path while therein storing the up-stream side substance, the down-stream side storage chamber 6 connected to the down-stream side of the flow path while therein storing the down-stream side substance, and a substance contraction means (seal member 12) capable of making the size of the up-stream side substance smaller than a size it has had while being stored in the up-stream side storage chamber. The up-stream side substance is stored in the up-stream side storage chamber for a prescribed period of time while being sent through the flow path into the down-stream side storage chamber when the up-stream side substance is reduced to a prescribed size by the contraction means.


Inventors:
HAYASHI MASAMICHI
YAMASHITA TATSUMARO
Application Number:
JP2004221198A
Publication Date:
February 09, 2006
Filing Date:
July 29, 2004
Export Citation:
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Assignee:
ALPS ELECTRIC CO LTD
International Classes:
G01N35/08; G01N37/00
Attorney, Agent or Firm:
野▲崎▼ 照夫
Masayoshi Miwa