To provide a polarization measuring device enabling manufacture of a device capable of polarization analysis in a wide wavelength area with a simple constitution.
This polarization measuring device including a phase shifter array, an analyzer, and a light-receiving element array is described as follows: the phase shifter array includes a patterning optical anisotropic layer; the patterning optical anisotropic layer has two or more domains having each different phase difference value; the domains have mutually all the same slow axis directions; the phase shifter array, the analyzer, and the light-receiving element array are arranged in this order in the vertical direction of the patterning optical anisotropic layer; the analyzer is a polarizer 1 having a uniform transmission axis direction to light passing the patterning optical anisotropic layer in the vertical direction; and the light-receiving element array has a function for receiving individually in each domain, light passing the patterning optical anisotropic layer in the vertical direction.
KANEIWA HIDEKI
TASAKA TOMOKI
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