Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
POOR CONTACT MEASURING METHOD AND POOR CONTACT MEASURING DEVICE
Document Type and Number:
Japanese Patent JP2011054522
Kind Code:
A
Abstract:

To provide a poor contact measuring method and a poor contact measurement determination device, which can measure existence of a poor contact while a male terminal and female contact are connected to each other.

Noises at a male terminal 108 side and noises at a female terminal 116 side are detected and compared with each other from the outside of housings 110, 118 of coupler units 100, 101 in a current conduction state, and output showing the difference is attained when a difference exists between the noises at the male terminal 108 side and the noises at the female terminal 116 side.


Inventors:
MARUYAMA SUSUMU
Application Number:
JP2009204611A
Publication Date:
March 17, 2011
Filing Date:
September 04, 2009
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HONDA MOTOR CO LTD
International Classes:
H01R43/00; H01R13/46
Attorney, Agent or Firm:
Takehiro Chiba
Toshiyuki Miyadera
Shuji Ouchi