Title:
位置測定方法
Document Type and Number:
Japanese Patent JP7310541
Kind Code:
B2
Abstract:
A position measurement method is used by a device including an imaging unit and a position detector that detects a position of the imaging unit to measure, using a detection value at imaging of a measurement point, position coordinates of the measurement point. The method for correcting the detection value from the position detector includes obtaining, with the device, position coordinates of predetermined indices (22) arranged two-dimensionally on a calibration plate (20) as an actual measurement value, obtaining, as a correction value, a difference between the actual measurement value and a true value resulting from transformation of position coordinates of the indices (22) with respect to a reference point on the calibration plate (20), and correcting the detection value from the position detector (8, 9, 10). The imaging unit (3) images measurement points (P) on the measurement target (3) to measure position coordinates of the measurement points (P).
Inventors:
Shingo Hayashi
Akihisa Matsuyama
Akihisa Matsuyama
Application Number:
JP2019195716A
Publication Date:
July 19, 2023
Filing Date:
October 28, 2019
Export Citation:
Assignee:
Omron Corporation
International Classes:
G01B11/00
Domestic Patent References:
| JP2001108409A | ||||
| JP2016205957A |
Foreign References:
| WO2019058729A1 |
Attorney, Agent or Firm:
Patent Attorney Corporation Shuwa Patent Office