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Title:
POSITIVE RESIST MATERIAL AND PATTERNING METHOD
Document Type and Number:
Japanese Patent JP2022183029
Kind Code:
A
Abstract:
To provide a positive resist material that has sensitivity and resolution surpassing those of the conventional positive resist material, is small in edge roughness and dimensional variation, and has a good pattern profile after exposure, and a patterning method.SOLUTION: A positive resist material contains a base polymer containing a repeat unit having a hydrogen atom of a carboxy group substituted with a nitrobenzene ring-containing tertiary hydrocarbyl group.SELECTED DRAWING: None

Inventors:
HATAKEYAMA JUN
FUKUSHIMA MASAHIRO
Application Number:
JP2022077365A
Publication Date:
December 08, 2022
Filing Date:
May 10, 2022
Export Citation:
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Assignee:
SHINETSU CHEMICAL CO
International Classes:
G03F7/039; C07D307/93; C07D333/76; C08F212/08; C08F220/10; G03F7/004
Attorney, Agent or Firm:
Patent Attorney Corporation Eimei International Patent Office