Title:
分散型プロセス制御システムにおける予測高周波ノイズ補償
Document Type and Number:
Japanese Patent JP2006514765
Kind Code:
A
Abstract:
A control system includes a measurement device capable of gathering high frequency process parameter data, a modeling routine which uses the high frequency parameter data to develop a model of the high frequency noise and a compensation routine that employs the developed model to adjust a control signal to thereby compensate for the high frequency noise present within the process parameter. The measurement device may measure a process variable at a relatively high frequency and send a subset of the measured data (e.g., the low frequency data) to a standard controller that generates a control signal to control the measured process parameter in any known manner. The modeling routine analyzes the high frequency data and develops a mathematical model of the high frequency noise within the process variable. The resulting mathematical model may then be used by the compensation routine to alter the standard control signal produced by the controller before that control signal is delivered to or used by the device being controlled.
Inventors:
Keith, Marion A.
Application Number:
JP2004567991A
Publication Date:
May 11, 2006
Filing Date:
September 23, 2003
Export Citation:
Assignee:
Rosemount Analytical, Inc.
International Classes:
G05B11/36; G01D3/028; G05B13/04; G05B17/02; G05B21/02; G08C15/00
Domestic Patent References:
| JPH08278343A | 1996-10-22 | |||
| JPH11281703A | 1999-10-15 | |||
| JPH07191707A | 1995-07-28 | |||
| JPH10177401A | 1998-06-30 | |||
| JPS5930104A | 1984-02-17 | |||
| JPS57101901A | 1982-06-24 | |||
| JP2001202103A | 2001-07-27 |
Attorney, Agent or Firm:
Yoshihiro Tsunoda
Yasu Furukawa
Toshio Nishitani
Keiji width
Yu Nakao
Yasu Furukawa
Toshio Nishitani
Keiji width
Yu Nakao