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Title:
PRETREATMENT DEVICE IN FLAW DETECTING SYSTEM OF HIGH- TEMPERATURE MATERIAL TO BE EXAMINED
Document Type and Number:
Japanese Patent JPS56122619
Kind Code:
A
Abstract:

PURPOSE: To thoroughly remove stuck material and assure reset time and prevent the formation of a secondary scale, by keeping the impact force of the pressurized water of descaling device at specific values, providing an interval necessary for recuperation of a material to be examined between said device and a flaw detector and providing an inert gas chamber over the overall length.

CONSTITUTION: A material 1 to be examined is scarfed by a hot scarfer 6, and is sent to a descaling device 8, where it is removed of stuck material by the pressurized water of ≥0.4kg/cm2 impact force to the material 1 from an injection header 9. Thence, it is sent to a flaw detector 7, and the interval L during this time is set at such an interval L at which the recuperation time necessary for eliminating the temp. unevenness of the material 1 caused by the injection of the pressurized water is secured. In this part, an inert gas chamber 10 is provided approximately over the overall length, whereby the formation of a secondary scale of the material 1 is prevented.


Inventors:
KOBAYASHI AKIRA
MORII HIROSHI
HIROSE ISAMU
NAKAI YASUHIDE
NISHIMOTO YOSHIROU
Application Number:
JP2596580A
Publication Date:
September 26, 1981
Filing Date:
February 28, 1980
Export Citation:
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Assignee:
KOBE STEEL LTD
International Classes:
B21C51/00; G01N21/88; G01N21/89; G01N21/892; (IPC1-7): B21C51/00; G01N21/88



 
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