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Title:
プローブアンテナ及び測定装置
Document Type and Number:
Japanese Patent JP6962173
Kind Code:
B2
Abstract:
To provide a probe antenna capable of improving spatial resolution when measuring an electromagnetic field emitted from an object to be measured or scattered by the object to be measured.SOLUTION: The probe antenna has a waveguide (2) that is formed of a conductor in a hollow cylindrical shape and has the size through which electromagnetic waves having a predetermined operating frequency are transmissible. The waveguide (2) has an opening (12) formed in one end face (11). The length in a short side direction in a portion of the opening (12) in a long side direction is shorter than the length in the opening end of the opening (12) in the short side direction.SELECTED DRAWING: Figure 1

Inventors:
Takao Fujii
Satoshi Takahashi
Application Number:
JP2017239474A
Publication Date:
November 05, 2021
Filing Date:
December 14, 2017
Export Citation:
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Assignee:
富士通株式会社
International Classes:
H01Q13/10; G01R29/08; G01R29/10; H01Q13/06
Domestic Patent References:
JP2017207464A
JP63245102A
JP6303001A
JP2035801A
JP9015282A
JP2004172736A
JP2012013612A
JP2016530539A
Foreign References:
WO2017187541A1
WO2010122860A1
WO2016084975A1
Attorney, Agent or Firm:
Atsushi Aoki
Koichi Itsubo
Tsutomu Kono
Tetsuo Miyamoto



 
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