To realize a probe card capable of reducing an. overdrive quantity capable of securing a needle pressure necessary for measurement or inspection of an electric characteristic by a probe needle, preventing side slip of the probe needle on an electrode of a test object, preventing damage or breaking of the electrode of the test object, and coping with miniaturization of the test object.

An opening 22 for marking where the head part of a marking device can be inserted is formed on a region other than an opening 21 for inspection where a probe needle 4 is projected, therefore, if a test object is miniaturized, the opening 21 for inspection is reduced to thereby shorten the length from the end fixed on a fixing part 5 of the probe needle 4 to a bent part. Hereby, an overdrive quantity capable of securing a needle pressure necessary for inspection of an electric characteristic by the probe needle 4 can be reduced. The overdrive quantity can also be reduced by shortening the length of a tapered part on the head part of the probe needle 4.