Title:
四重極型質量分析装置
Document Type and Number:
Japanese Patent JP6733819
Kind Code:
B2
Abstract:
Measurement of a standard sample is repeated under control of an analysis control unit (94) while a CD voltage applied to a conversion dynode (61) of a detection unit (6) is gradually changed by a CD voltage adjustment unit (96). Then, every time a measured mass spectrum is obtained, a spectrum pattern determination unit (93) determines whether a pattern of the measured mass spectrum matches a pattern of a standard mass spectrum of a standard sample in a compound database (92), and determines the CD voltage at the time of being regarded as matching to be the set value. When the pattern of the mass spectrum is adjusted by changing the voltage applied to the ion lens (3), performance such as sensitivity is likely to be unstable due to stain on the lens electrode or the like, but since the detection unit (6) is unlikely to be affected by such a stain, unstable performance can be avoided.
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Inventors:
Manabu Shimomura
Application Number:
JP2019526050A
Publication Date:
August 05, 2020
Filing Date:
June 29, 2017
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
H01J49/00; G01N27/62; H01J43/04; H01J49/02; H01J49/06
Domestic Patent References:
| JP5217547A | ||||
| JP2002329474A |
Foreign References:
| WO2016117053A1 | ||||
| US20090206247 | ||||
| WO2016162658A1 |
Attorney, Agent or Firm:
Kyoto International Patent Office