Title:
ACCURACY MANAGEMENT METHOD OF SPECIMEN ANALYSIS SYSTEM, AND SPECIMEN ANALYSIS SYSTEM
Document Type and Number:
Japanese Patent JP2023123825
Kind Code:
A
Abstract:
To provide an accuracy management method of a specimen analysis system capable of accurately meeting user's needs.SOLUTION: An accuracy management method of a specimen analysis system comprises: accepting setting of conditions for accuracy management measurement; determining one or more accuracy management specimens to be used for accuracy management measurement from among a plurality of accuracy management specimens stored in a storage, according to the conditions for accuracy management measurement and information on the accuracy management specimens stored in a storage unit; taking out the determined accuracy management specimens from the storage and transporting them to a measurement unit; and measuring the transported accuracy management specimens in the measurement unit.SELECTED DRAWING: Figure 24
Inventors:
WAKAMIYA YUJI
UEMURA TORU
OMAE YUICHIRO
HAYAMA YUKIKATA
UEMURA TORU
OMAE YUICHIRO
HAYAMA YUKIKATA
Application Number:
JP2023111126A
Publication Date:
September 05, 2023
Filing Date:
July 06, 2023
Export Citation:
Assignee:
SYSMEX CORP
International Classes:
G01N35/00; G01N35/02
Attorney, Agent or Firm:
Patent Attorney Corporation YKI International Patent Office
Previous Patent: Large surface area temperature sensor
Next Patent: Coin hopper, coin hopper rotating body, and coin processing device
Next Patent: Coin hopper, coin hopper rotating body, and coin processing device