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Patent Searching and Data


Title:
RADIATION ANALYZING APPARATUS FOR BOTH EDX/WDX
Document Type and Number:
Japanese Patent JPH01185480
Kind Code:
A
Abstract:

PURPOSE: To obtain a radiation analyzing apparatus having a simple constitution at a low cost, by providing an EDX/WDX address switch, into which the signals from a signal processing circuit, an angle reader and an ROI signal generating circuits are inputted.

CONSTITUTION: A second signal processing circuit part 3b forms and outputs wave height data A and a store signal B on the basis of the input signal from a radiation detector 1b. These signals, angle data θ or 2θ from an angle reader 2 and an ROI signal (f) from an ROI signal generating circuit 7 are inputted into an EDX/WDX address switch Z. Under the state the switch Z is used in the EDX (or WDX) state, the switch Z is alternately changed so that the stored signal and the wave height data, which are inputted from the circuit part 3b (or with the angle data inputted from the reader 2 as address data and the ROI signal from the circuit 7 as the store data), are supplied into a second multichannel analyzer 8b. Since expensive memory elements as constituent elements can be omitted, the apparatus can be constituted simple as a whole at a low cost.


Inventors:
WAKIYAMA YOSHIHIRO
MIZUNO FUMIO
SATO YOSHIMICHI
KUMAKURA KOICHI
Application Number:
JP1131288A
Publication Date:
July 25, 1989
Filing Date:
January 20, 1988
Export Citation:
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Assignee:
HORIBA LTD
International Classes:
G01N23/00; G01T1/36; (IPC1-7): G01N23/00; G01T1/36
Attorney, Agent or Firm:
Hideo Fujimoto